Sm. Stephens et Ra. Dluhy, IN-SITU AND EX-SITU STRUCTURAL-ANALYSIS OF PHOSPHOLIPID-SUPPORTED PLANAR BILAYERS USING INFRARED-SPECTROSCOPY AND ATOMIC-FORCE MICROSCOPY, Thin solid films, 285, 1996, pp. 381-386
We report here both the in-situ and ex-situ study of phospholipids inc
orporated into supported planar bilayers using spectroscopic and imagi
ng techniques. We have demonstrated the feasibility of using attenuate
d total. reflectance infrared (ATR-IR) spectroscopy for the insitu stu
dy of Langmuir monolayers at the air-water interface. This method resu
lts in a higher signal-to-noise ratio and more easily measured molecul
ar orientation when compared with the external reflection infrared met
hod previously developed. For ex-situ studies, we have demonstrated th
at a combination of IR spectroscopy and atomic force microscopy (AFM)
provides detailed information concerning the conformation and distribu
tion of the bilayer components. Our AFM images of the phospholipid 1,2
-dipalmitoyl-sn-glycero-3-phosphocholine (DPPC) show molecularly-resol
ved phospholipid headgroups existing in a well-ordered, hexagonal-type
lattice with unit cell areas obtained from these images corresponding
to molecular areas commensurate with those obtained by X-ray diffract
ion from analogous phospholipid single crystals. Our results demonstra
te that the combination of IR and AFM is a powerful tool for structura
l investigation of supported planar bilayers.