PROJECTILE ENERGY-DEPENDENCE OF L X-RAY-EMISSION FROM FAST, HIGHLY-CHARGED XE IONS TRAVELING IN SOLIDS

L x-ray emission from Xe ions incident on a variety of solid targets a t energies ranging from 6 to 15 MeV/u has been investigated using a cu rved crystal spectrometer of moderate resolution. Analysis of the spec tra provided estimates of the average charges and (in some cases) the charge distributions of those ions emitting L, x rays inside the targe ts. Calculations employing theoretical electron capture and loss cross sections were used to examine the dependence on depth within the targ et of contributions to the spectra from Xe ions having different avera ge numbers of L and M electrons. Average charges and charge distributi ons deduced from the x-ray spectra were found to agree quite well with those predicted by the model calculations.