Unintentionally doped GaAs layers were grown on semi-insulating GaAs s
ubstrates by metal-organic chemical vapor deposition. Temperature-depe
ndent electrical transport measurements were performed and the layer c
haracteristics were derived by a two-layer analysis. The substrate beg
ins to affect the layer transport properties at low temperatures, depe
nding on the carrier density and the layer thickness. The p-type sampl
es show two conductivity-type conversions at two different temperature
s. One is a combined transport phenomenon of the layer and substrate,
and the other occurs in the layer but is still influenced by the subst
rate. A two-band model involving light- and heavy-hole bands was adopt
ed in analyzing the hole transport in the layer, and the light hole wa
s determined to play a crucial role even with its very small effective
mass compared to the heavy hole.