PORTABLE TECHNOLOGICAL MAGNETIC-X-RAY PHOTOELECTRON SPECTROMETER

A small-size portable XPS spectrometer with pi root 2 double focusing in an axisymmetric magnetic field is described. The radius of the midd le electron trajectory is 12 cm, and the maximum beam divergence angle s in the radial and axial directions are 1 degrees and 5 degrees, resp ectively. The solid angle amounts to 0.22% of 4 pi, the relative apert ure is 0.1%, and the apparatus line broadening is 5 x 10(-4). The XPS spectrometer is capable of analyzing photoelectrons with energies betw een 0 and 2 keV. The energy analyzer size and weight are 40 x 40 x 45 cm and 30 kg, respectively.