Y. Mihashi et al., LONG-WAVELENGTH RECEIVER OPTOELECTRONIC INTEGRATED-CIRCUIT ON 3-INCH-DIAMETER GAAS SUBSTRATE GROWN BY INP-ON-GAAS HETEROEPITAXY, JPN J A P 1, 33(5A), 1994, pp. 2599-2604
A monolithic long-wavelength receiver optoelectronic integrated circui
t (OEIC), which integrates an InGaAs PIN-photodiode (PD) and a GaAs fi
eld-eff ect transistor (FET), has been successfully fabricated on a 3-
inch-diameter GaAs substrate using InP-on-GaAs heteroepitaxy, by metal
organic chemical vapor deposition (MOCVD) and conventional GaAs-IC pro
cess technology. The epitaxial quality of the PD layer has been improv
ed by use of a low-temperature-grown buffer layer, thermal cyclic anne
aling and an InGaAs/InP strained-layer superlattice. The integrated PD
has low dark current of 10 nA at -5 V bias voltage, and exhibited sta
ble operation at 175-degrees-C. The fabricated receiver OEIC has 1.4 G
Hz bandwidth and sensitivity of -28.1 dBm at the transmission rate of
622 Mb/s with bit error rate of 10(-9), which is applicable to practic
al subscriber optical communication systems.