Jh. Yang et al., EFFECT OF AN EXTERNAL ELECTRIC-FIELD ON CHARGE-TRANSFER AT A FUNCTIONAL MONOLAYER N-SI(111) INTERFACE/, Thin solid films, 285, 1996, pp. 477-480
The functional organic monolayer/n-Si(111) assembly was fabricated for
an investigation of photoelectric memory effect by the Langmuir-Blodg
ett technique from 2-carboxyethyl)-4-[4'-N,N-(dioctadecylamino)stryl]
pyridium (P-I). The measurement of the surface photovoltage spectra (S
PS) of this assembly shows that it has an erasable photoelectric memor
y effect: after a voltage of 20 V was applied to this assembly upon ir
radiation with visible light, the surface photovoltage (SPV) of this a
ssembly becomes stronger, the increase of SPV can remain; followed by
the application of a voltage of -20 V in the dark the SPV can return t
o the initial value (i.e. the value without being treated with an exte
rnal field). Based on the principle of surface photovoltage spectrosco
py, it is suggested that the electron acceptor 2-carboxyethyl pyridium
in the hydrophilic head of P-I can capture the photogenerated electro
n from the conduction band of n-Si(lll) as an electron trap upon irrad
iation with visible light under the help of a positive external electr
ic field, and the trapped electron can return to the conduction band o
f n-Si(111) on the application of a negative external electric field.