Cm. Park et al., EXCHANGE COUPLING BETWEEN ANTIFERROMAGNETIC NIO AND FERROMAGNETIC-FILMS, Journal of the Korean Physical Society, 31(3), 1997, pp. 508-511
We investigated the exchange field (H-ex) and the coercive field (H-e)
for Ni81Fe19 films deposited on antiferromagnetic NiO films as Functi
ons of the NiFe and the NiO thicknesses, the applied deposition field,
and the annealing temperature. The H-ex and H-c in the NiFe(50 Angstr
om)/NiO(300 Angstrom) bilayer were about 95 Oe and 44 Oe, respectively
. Both H-ex and H-c varied approximately inversely with the thickness
of the NiFe layer and saturated above a NiO film thickness of 300 Ht.
The H-ex of the NiFe(200 Angstrom)/NiO(300 Angstrom) bilayer increased
with the applied deposition field up to 360 Oe. The H-ex disappeared
rapidly after annealing at 230 degrees C. We also studied the dependen
ce of the exchange field and the magnetoresistance ratio on the thickn
ess(t is 20, 70, and 100 Angstrom) of the pinned NiFe layer in Ta(50 A
ngstrom)/NiFe(50 Angstrom)/Cu(40 Angstrom)/NiFe(t)/NiO(300 Angstrom) s
pin valve films.