HIGH-RESOLUTION OPTICAL-SPECTRA FROM ULTRATHIN QUATERTHIOPHENE FILMS

Citation
W. Gebauer et al., HIGH-RESOLUTION OPTICAL-SPECTRA FROM ULTRATHIN QUATERTHIOPHENE FILMS, Thin solid films, 285, 1996, pp. 576-580
Citations number
16
Categorie Soggetti
Physics, Applied","Material Science","Physics, Condensed Matter
Journal title
ISSN journal
00406090
Volume
285
Year of publication
1996
Pages
576 - 580
Database
ISI
SICI code
0040-6090(1996)285:<576:HOFUQF>2.0.ZU;2-3
Abstract
The linear optical properties of quaterthiophene (4T) films of about 2 5 ti thickness were studied, The films were fabricated by vapour depos ition of 4T on highly oriented pyrolytic graphite under high vacuum. I n the photoluminescence and reflection spectra the vibronic lines are very sharp (FWHM (0-0) less than or equal to 50 cm(-1)) indicating a h igh degree of structural order in the films. This is supported by the absence of thermal quenching of the luminescence. Comparison with spec tra of matrix-isolated 4T reveals very similar vibrational energies, i ndicating an undistorted structural conformation of 4T in the film, bu t some additional modes, probably ring deformation modes, are found. I n the reflection spectra a splitting of 170 cm(-1) is observed for the first excited electronic level which is tentatively interpreted as Da vydov splitting.