STATISTICAL-ANALYSIS OF A MIXED-LAYER X-RAY-DIFFRACTION PEAK

Citation
L. Rebolloneira et al., STATISTICAL-ANALYSIS OF A MIXED-LAYER X-RAY-DIFFRACTION PEAK, Journal of physics. D, Applied physics, 30(17), 1997, pp. 2462-2469
Citations number
23
Categorie Soggetti
Physics, Applied
ISSN journal
00223727
Volume
30
Issue
17
Year of publication
1997
Pages
2462 - 2469
Database
ISI
SICI code
0022-3727(1997)30:17<2462:SOAMXP>2.0.ZU;2-U
Abstract
A mathematical model to describe the line shape of an x-Pay diffractio n peak from stacks of different layers such as, for instance, an inter stratified clay mineral has been evolved, The aim was to be able to an alyse the proportions of different specific stacking sequences in two- component interstratified samples. a maximum-entropy algorithm was app lied to observed powder-diffraction intensities in order to obtain the probability of each stacking sequence. Application to natural smectit e-illite clays gave reasonable results.