L. Rebolloneira et al., STATISTICAL-ANALYSIS OF A MIXED-LAYER X-RAY-DIFFRACTION PEAK, Journal of physics. D, Applied physics, 30(17), 1997, pp. 2462-2469
A mathematical model to describe the line shape of an x-Pay diffractio
n peak from stacks of different layers such as, for instance, an inter
stratified clay mineral has been evolved, The aim was to be able to an
alyse the proportions of different specific stacking sequences in two-
component interstratified samples. a maximum-entropy algorithm was app
lied to observed powder-diffraction intensities in order to obtain the
probability of each stacking sequence. Application to natural smectit
e-illite clays gave reasonable results.