Ch. Wan et al., LINKED MAGNETRON SPUTTERING AND PULSED-LASER DEPOSITION UHV CHAMBERS FOR THE PREPARATION OF EPITAXIAL METAL-METAL OXIDE MULTILAYERS, Measurement science & technology, 8(9), 1997, pp. 978-985
A UHV deposition system for the production of epitaxial oxide/metal he
terostructures on single crystal ceramic substrates is described, The
system has two novel features. The first is the use of linked, dedicat
ed UHV sputtering and pulsed laser deposition chambers for the metal a
nd oxide growth respectively, so as to maintain the cleanliness of the
metal surface alter deposition. The second is the use of a pulsed oxy
gen source during oxide growth to minimize damage of the metal layer b
y oxidation during the growth of the oxide layer. This second issue is
illustrated by the growth of magnesium oxide/niobium bilayers on sapp
hire substrates. The magnesium oxide was grown under varying condition
s of oxygen supply. A clean niobium film with net magnesium oxide over
layer showed a resistance ratio of 76. if the magnesium oxide was grow
n under UHV conditions (no extra oxygen supply) then the resistance ra
tio of the niobium film was reduced to 26. Growth of the magnesium oxi
de with synchronous 0.6 ms oxygen pulses (total ambient oxygen exposur
e 121 Pa s) resulted in a niobium resistance ratio of 18. A similar ex
posure to oxygen pulses alone (no magnesium oxide layer) reduced the n
iobium resistance ratio to 1.2, Alternatively the magnesium oxide laye
r could be grown in an argon ambient, with maintenance of the residual
resistance ratio at 60 in 20 Pa of argon.