A SPHERICAL CAPACITIVE PROBE FOR MEASURING THE THICKNESS OF COATINGS ON METALS

Authors
ZHANG RJ DAI SG MU PA
Citation
Rj. Zhang et al., A SPHERICAL CAPACITIVE PROBE FOR MEASURING THE THICKNESS OF COATINGS ON METALS, Measurement science & technology, 8(9), 1997, pp. 1028-1033
Citations number
2
Categorie Soggetti
Instument & Instrumentation",Engineering
Journal title
Measurement science & technology → ACNP
ISSN journal
09570233
Volume
8
Issue
9
Year of publication
1997
Pages
1028 - 1033
Database
ISI
SICI code
0957-0233(1997)8:9<1028:ASCPFM>2.0.ZU;2-D
Abstract
This paper proposes a new method of using the spherical capacitive pro be instead of the common planar probe to increase the accuracy in meas uring the thickness of non-conducting coatings on metals. The measurin g conversion model of the spherical capacitive probe and Its electric circuit are discussed and effective methods for overcoming the unfavou rable influence caused by the spherical capacitive probe are introduce d as well.