CONTACTLESS CHARACTERIZATION OF 2D-ELECTRONS IN GAN ALGAN HFETS/

Citation
H. Alause et al., CONTACTLESS CHARACTERIZATION OF 2D-ELECTRONS IN GAN ALGAN HFETS/, DIAMOND AND RELATED MATERIALS, 6(10), 1997, pp. 1536-1538
Citations number
5
Categorie Soggetti
Material Science
ISSN journal
09259635
Volume
6
Issue
10
Year of publication
1997
Pages
1536 - 1538
Database
ISI
SICI code
0925-9635(1997)6:10<1536:CCO2IG>2.0.ZU;2-2
Abstract
We report on properties of 2D carriers in an GaN/AlGaN heterojunction investigated by an optical method. This method consists of a cyclotron resonance (CR) experiment where optical absorption is measured under fixed magnetic fields up to 13 T. We introduce a theoretical approach that allows to interpret cyclotron resonance due to the thin 2D layer on the sapphire substrate. The presented contactless characterisation method gives access to some very important parameters of the bidimensi onal gas such as the carrier concentration, their mobility and their e ffective mass. (C) 1997 Elsevier Science S.A.