PARAMETRIC STUDY OF REFLECTION CHARACTERISTICS AT AHIRAL-CHIRAL INTERFACES

Materials described by the constitutive relations sigma(ji)=mu gamma(j i)+mu gamma(ji)+lambda(gamma kappa kappa)delta(ij)+c kappa(ji) and i)= (xi+epsilon)kappa(ji)+(xi-epsilon)kappa(ij)???? +eta kappa(kappa kappa )delta(ij)+c gamma(ji) lack inversion symmetry due to chirality in the ir microstructures. Six wavenumbers are possible solutions for dispers ion equations in acoustically active (chiral) medium. Two of these wav enumbers represent longitudinally polarized elastic waves, the remaini ng four wavenumbers stand for circularly polarized elastic waves. In t his paper, reflection characteristics of elastic waves normally imping ing upon achiral-chiral interfaces are thoroughly discussed. The effec ts of the constitutive parameters of chiral medium on reflection coeff icients are elucidated. Simulation results illustrate that reflection coefficients may vanish by properly tailoring constitutive parameters of chiral medium. The methods for determining constitutive parameters of chiral medium for zero reflection at achiral-chiral interfaces are developed. Results obtained in this study can be applied for designing state-of-the-art acoustic materials; e.g. acoustic shielding and abso rptive materials, using chiral composites.