EXCIMER-LASER ABLATION AND MICRO-PATTERNING OF CERAMIC SI3N4

Citation
J. Heitz et al., EXCIMER-LASER ABLATION AND MICRO-PATTERNING OF CERAMIC SI3N4, Applied physics A: Materials science & processing, 65(3), 1997, pp. 259-261
Citations number
15
Categorie Soggetti
Physics, Applied
ISSN journal
09478396
Volume
65
Issue
3
Year of publication
1997
Pages
259 - 261
Database
ISI
SICI code
0947-8396(1997)65:3<259:EAAMOC>2.0.ZU;2-X
Abstract
Excimer-laser ablation and micro-patterning of ceramic Si3N4 has been investigated. The ablation threshold in air, Phi(th), is around 0.3 +/ - 0.1 J/cm(2) with ArF- and 0.9 +/- 0.2 J/cm(2) with KrF-laser radiati on. With fluences Phi(th) < Phi less than or equal to 4 J/cm(2) the ir radiated surface is either very flat or it ex hibits a cone-type struc ture, depending on the number of laser pulses employed. With fluences of 5 to 10 J/cm(2), the sample surface becomes very smooth, much smoot her than the original mechanically polished surface. Pores, scratches, and cracks observed on the non-irradiated surface are absent within t he illuminated area. In this regime, the ablation rates are typically 0.1 to 0.2 mu m/pulse.