Citation
Yc. Liu et al., PIXE ANALYSIS OF SILK, Journal of applied polymer science, 66(2), 1997, pp. 405-408
Citations number
23
Categorie Soggetti
Polymer Sciences
Journal title
ISSN journal
00218995
Volume
66
Issue
2
Year of publication
1997
Pages
405 - 408
Database
ISI
SICI code
0021-8995(1997)66:2<405:PAOS>2.0.ZU;2-Z
Abstract
The method of proton-induced X-ray emission (PIXE) was first utilized
to analyze the elements in silk. Different kinds of silk from home and
the wild were examined. The results show that every silk, besides C,
H, O, and N, contains many types of elements such as Si, P, S, Ca, Mn,
Fe, Cu, Zn, and Sr and different samples have different relative cont
ents. (C) 1997 John Wiley & Sons, Inc.