X-RAY TOPOGRAPHY OF TETRAGONAL LYSOZYME GROWN BY THE TEMPERATURE-CONTROLLED TECHNIQUE

Growth-induced defects in lysozyme crystals were observed by white-bea m and monochromatic X-ray topography at the National Synchrotron Light Source (NSLS) at the Brookhaven National Laboratory (BNL). The topogr aphic methods were non-destructive to the extent that traditional diff raction data collection could be performed to high resolution after to pography. It was found that changes in growth parameters, defect conce ntration as detected by X-ray topography, and the diffraction quality obtainable from the crystals were all strongly correlated. In addition , crystals with fewer defects showed lower mosaicity and higher diffra ction resolution as expected.