Rgc. Oudshoorn et al., REFRACTIVE-INDEX AND LAYER THICKNESS OF AN ADSORBING PROTEIN AS REPORTERS OF MONOLAYER FORMATION, Thin solid films, 285, 1996, pp. 836-840
A method is presented for a separate real-time determination of refrac
tive index and layer thickness of an adsorbing thin layer, The changin
g angular deflections of TE and TM modes in a dedicated planar wavegui
de structure are measured. A resolution of 0.01 in the refractive inde
x and 0.5 nm in the average thickness is obtained. The method is illus
trated with experimental results on the binding of an antibody to the
substrate, both in a physisorption and in an immunoreaction. In the la
tter, results are consistent with an end-on binding of the antibody to
the surface.