REFRACTIVE-INDEX AND LAYER THICKNESS OF AN ADSORBING PROTEIN AS REPORTERS OF MONOLAYER FORMATION

Citation
Rgc. Oudshoorn et al., REFRACTIVE-INDEX AND LAYER THICKNESS OF AN ADSORBING PROTEIN AS REPORTERS OF MONOLAYER FORMATION, Thin solid films, 285, 1996, pp. 836-840
Citations number
11
Categorie Soggetti
Physics, Applied","Material Science","Physics, Condensed Matter
Journal title
ISSN journal
00406090
Volume
285
Year of publication
1996
Pages
836 - 840
Database
ISI
SICI code
0040-6090(1996)285:<836:RALTOA>2.0.ZU;2-L
Abstract
A method is presented for a separate real-time determination of refrac tive index and layer thickness of an adsorbing thin layer, The changin g angular deflections of TE and TM modes in a dedicated planar wavegui de structure are measured. A resolution of 0.01 in the refractive inde x and 0.5 nm in the average thickness is obtained. The method is illus trated with experimental results on the binding of an antibody to the substrate, both in a physisorption and in an immunoreaction. In the la tter, results are consistent with an end-on binding of the antibody to the surface.