A series of NdFeB (Nd12Fe82B6) films of different thicknesses were r.f
. sputtered on 1000 Angstrom - thick Pt underlayers for information st
orage application. The perpendicular coercivity has a maximum of 3000
Oe for a 1000 Angstrom - thick film annealed at 625 degrees C for fift
een minutes. By using Transmission Electron Microscopy (TEM) we have f
ound that the film is tetragonal with an additional fee structure. The
crystallographic texture is established during annealing at 625 degre
es C. The TEM micrographs show some voids and a grain size in the rang
e 30 to 50 nm. For films annealed at 700 degrees C for fifteen minutes
, the voids disappeared and the grain size was found to be 100 nm. X-R
ay Diffraction analysis of the annealed sample indicates that the NdFe
B film is amorphous.' Annealing at 625 degrees C produces the 2:15 :1
phase in the films.