COMPARISON OF RECORDING PROPERTIES OF ME TAPE AND THIN MP TAPE WITH RESPECT TO OVERWRITE BEHAVIOR

Citation
S. Lalbahadoersing et al., COMPARISON OF RECORDING PROPERTIES OF ME TAPE AND THIN MP TAPE WITH RESPECT TO OVERWRITE BEHAVIOR, IEEE transactions on magnetics, 33(5), 1997, pp. 3061-3063
Citations number
11
Categorie Soggetti
Engineering, Eletrical & Electronic","Physics, Applied
ISSN journal
00189464
Volume
33
Issue
5
Year of publication
1997
Part
1
Pages
3061 - 3063
Database
ISI
SICI code
0018-9464(1997)33:5<3061:CORPOM>2.0.ZU;2-6
Abstract
Differences between the recording characteristics of thin MP and ME ta pe are studied. The effect of the thickness reduction of MP tape is al so investigated. When thin MP tape (with thickness 140 nm) is compared with ME tape (with thickness 150 nm), we observe a better signal and overwrite response for the ME tape. Through simulations the influence of an easy axis out-of-plane and a different reversal mechanism in ME tape is related to overwrite behavior.