S. Lalbahadoersing et al., COMPARISON OF RECORDING PROPERTIES OF ME TAPE AND THIN MP TAPE WITH RESPECT TO OVERWRITE BEHAVIOR, IEEE transactions on magnetics, 33(5), 1997, pp. 3061-3063
Differences between the recording characteristics of thin MP and ME ta
pe are studied. The effect of the thickness reduction of MP tape is al
so investigated. When thin MP tape (with thickness 140 nm) is compared
with ME tape (with thickness 150 nm), we observe a better signal and
overwrite response for the ME tape. Through simulations the influence
of an easy axis out-of-plane and a different reversal mechanism in ME
tape is related to overwrite behavior.