This study investigates the differences between two MP tapes exhibitin
g different stiction behavior. Surface roughness and microscale fricti
on of the tapes were measured using an Atomic Force/Friction Force Mic
roscope (AFM/FFM). Numerical modeling was used to predict the contact
area of the tape surfaces which were verified by actual measurement. H
ardness and elastic modulus' of the tapes were determined using a nano
indenter. Bending stiffness of the tapes was also measured. We found t
hat the tape exhibiting lower stiction showed lower contact area prima
rily due to higher kurtosis of the surface in addition to higher elast
ic modulus, hardness and bending stiffness than the tape exhibiting hi
gher stiction. Based on this study, tapes with surfaces exhibiting hig
h kurtosis are desirable for good stiction behavior. Higher values of
elastic modulus and bending stiffness are also favorable for low stict
ion. We also found that roughness measurements made with the AFM yield
ed better lateral resolution in tapping mode as compared to the conven
tional contact mode.