The effect of crystalline anisotropy on the device signal and edge swi
tching thresholds of both NiFeCo and NiFe anisotropic magnetoresistive
random access memory (AMRAM) cells has been simulated. The NiFe devic
e demonstrated a greater signal range with an edge switching threshold
of 50e, while the NiFeCo device showed a smaller range of signal but
with an edge switching threshold of 13Oe.