GMR IN CORRUGATED CO CU MULTILAYERS

A new corrugated material comprising anti ferromagnetically coupled Co /Cu multilayers was prepared using V-grooved Si substrates. Scanning e lectron microscopy and x-ray diffraction observations indicate that th e corrugated multilayers were successfully grown with the formation of smooth and clear interfaces, Magnetoresistance change with the sense current normal to the grooves was larger than that with the current pa rallel to the grooves. The MR enhancement due to the difference in mea surement geometry increased as the width of the grooves decreased.