EFFECT OF INTERFACE ON COUPLING OF NIFECO TAN/NIFECO SANDWICH FILMS/

Coupled NiFeCo/TaN/NiFeCo films with coercivity of 0.42 and 5.94 Oe we re obtained by varying the substrate bias conditions of the NiFeCo fil ms. The film with low coercivity had a sharp magnetization reversal pr ocess, i.e. small switching field distribution. On the other hand, a l arge switching field distribution, approximately 3.5 Oe, was found on the sample film with high coercivity. Such different magnetic characte ristic may be attributed to altering the domain wall energy associated with induced coupling at NiFeCo/TaN interface due to pit formation in the NiFeCo film.