THICKNESS VARIATION OF THE MAGNETIC-ANISOTROPY IN DYFE THIN-FILMS USING MAGNETOOPTICAL TECHNIQUES

Citation
R. Carey et al., THICKNESS VARIATION OF THE MAGNETIC-ANISOTROPY IN DYFE THIN-FILMS USING MAGNETOOPTICAL TECHNIQUES, IEEE transactions on magnetics, 33(5), 1997, pp. 3922-3924
Citations number
10
Categorie Soggetti
Engineering, Eletrical & Electronic","Physics, Applied
ISSN journal
00189464
Volume
33
Issue
5
Year of publication
1997
Part
2
Pages
3922 - 3924
Database
ISI
SICI code
0018-9464(1997)33:5<3922:TVOTMI>2.0.ZU;2-C
Abstract
Magneto-optical measurements of the anisotropy of homogeneous Dy18Fe82 films as a function of thickness (134.0-13.4 nm) confirm that the per pendicular anisotropy disappears when films are less than 60nm thick S ince, the range of films exhibits both out of plane and in-plant aniso tropy, both the polar Kerr effect and the transverse Kerr effect were used to determine the anisotropy, At about 60nm the perpendicular anis otropy K-perpendicular to less than or equal to the shape anisotropy ( K-s=2 pi M-s(2)).