MAGNETIC-RESONANCE FORCE MICROSCOPY WITH A PERMANENT-MAGNET ON THE CANTILEVER

Authors
Citation
Z. Zhang et Pc. Hammel, MAGNETIC-RESONANCE FORCE MICROSCOPY WITH A PERMANENT-MAGNET ON THE CANTILEVER, IEEE transactions on magnetics, 33(5), 1997, pp. 4047-4049
Citations number
6
Categorie Soggetti
Engineering, Eletrical & Electronic","Physics, Applied
ISSN journal
00189464
Volume
33
Issue
5
Year of publication
1997
Part
2
Pages
4047 - 4049
Database
ISI
SICI code
0018-9464(1997)33:5<4047:MFMWAP>2.0.ZU;2-9
Abstract
When the variation of the bias field is on the order of a few hundred gauss, permanent magnetic microparticles of Nd2Fe14B (NdFeB) mounted o n atomic force microscopy (AFM) cantilevers generate much smaller nonr esonance (NR) signals in the magnetic resonance force microscopy (MRFM ) spectra than most soft magnetic thin films. However, the interaction s of the NdFeB particle with the bias field cause an undesirable varia tion of the cantilever resonance frequency with changing bias field, O ur model indicates the importance of minimizing the polarized moment o f the magnetic tip and ensuring that the applied fields employed in th e MRFM experiment be highly uniform.