Z. Zhang et Pc. Hammel, MAGNETIC-RESONANCE FORCE MICROSCOPY WITH A PERMANENT-MAGNET ON THE CANTILEVER, IEEE transactions on magnetics, 33(5), 1997, pp. 4047-4049
When the variation of the bias field is on the order of a few hundred
gauss, permanent magnetic microparticles of Nd2Fe14B (NdFeB) mounted o
n atomic force microscopy (AFM) cantilevers generate much smaller nonr
esonance (NR) signals in the magnetic resonance force microscopy (MRFM
) spectra than most soft magnetic thin films. However, the interaction
s of the NdFeB particle with the bias field cause an undesirable varia
tion of the cantilever resonance frequency with changing bias field, O
ur model indicates the importance of minimizing the polarized moment o
f the magnetic tip and ensuring that the applied fields employed in th
e MRFM experiment be highly uniform.