SCANNING THE SPECIAL ISSUE ON AUTOMATED BIOMETRICS

Authors
SHEN WC KHANNA R
Citation
Wc. Shen et R. Khanna, SCANNING THE SPECIAL ISSUE ON AUTOMATED BIOMETRICS, Proceedings of the IEEE, 85(9), 1997, pp. 1343-1346
Citations number
NO
Categorie Soggetti
Engineering, Eletrical & Electronic
Journal title
Proceedings of the IEEE → ACNP
ISSN journal
00189219
Volume
85
Issue
9
Year of publication
1997
Pages
1343 - 1346
Database
ISI
SICI code
0018-9219(1997)85:9<1343:STSIOA>2.0.ZU;2-B