Ud. Schwarz et H. Haefke, INVESTIGATION OF PRECIPITATED COLLOIDAL PARTICLES BY SCANNING FORCE MICROSCOPY - SILVER-HALIDE MICROCRYSTALS, Applied physics. A, Solids and surfaces, 59(1), 1994, pp. 33-40
Scanning Force Microscopy (SFM) is presented as an alternative to elec
tron microscopy for the investigation of precipitated colloidal partic
les. The information which can be gained by SFM is illustrated by the
example of silver-halide microcrystals with different shapes and sizes
. Sample preparation and scan-related problems are discussed extensive
ly from general aspects.