POLING BEHAVIOR AT THE GRAIN-BOUNDARIES OF FERROELECTRIC PZT THIN-FILMS INVESTIGATED BY ELECTRIC SCANNING FORCE MICROSCOPY

Authors
FRANKE K HUELZ H SEIFERT S
Citation
K. Franke et al., POLING BEHAVIOR AT THE GRAIN-BOUNDARIES OF FERROELECTRIC PZT THIN-FILMS INVESTIGATED BY ELECTRIC SCANNING FORCE MICROSCOPY, Ferroelectrics. Letters section, 23(1-2), 1997, pp. 1-6
Citations number
10
Categorie Soggetti
Physics, Condensed Matter
Journal title
Ferroelectrics. Letters section → ACNP
ISSN journal
07315171
Volume
23
Issue
1-2
Year of publication
1997
Pages
1 - 6
Database
ISI
SICI code
0731-5171(1997)23:1-2<1:PBATGO>2.0.ZU;2-M
Abstract
The Electric Scanning Force Microscope is used to investigate the poli ng behaviour of ferroelectric PZT thin films. Successively measured po larization distributions were compared with high resolution. The polin g characteristics are investigated separately at the grain boundaries and inside the grain volumes. For films prepared by sol-gel processing , it is shown that the switchable polarization is decreased at the gra in boundaries with respect to the grain volumes. The coercive field is clearly increased at the grain boundaries.