CRYSTAL STRESS DYNAMICS BY MEANS OF NANOSECOND TIME-RESOLVED X-RAY-DIFFRACTION

Citation
P. Chen et al., CRYSTAL STRESS DYNAMICS BY MEANS OF NANOSECOND TIME-RESOLVED X-RAY-DIFFRACTION, Applied physics letters, 71(12), 1997, pp. 1646-1648
Citations number
18
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00036951
Volume
71
Issue
12
Year of publication
1997
Pages
1646 - 1648
Database
ISI
SICI code
0003-6951(1997)71:12<1646:CSDBMO>2.0.ZU;2-V
Abstract
Time-resolved transient lattice deformation in Pt (111) crystal has be en directly observed from the shift of a nanosecond x-ray diffraction rocking curve. The development of a tabletop nanosecond x-ray system, which consists of an excimer laser, x-ray diode, and charge coupled de vice detector is described. With this system, we observed the time-dep endent strain distribution during the laser heating process in the bul k of a Pt (111) crystal. This method provides a means of relative low cost for the study of fast transient properties and structures of mate rials. (C) 1997 American Institute of Physics.