The biaxial moduli of coherently strained Si1-xGex thin films have bee
n determined over the composition range x=0.15-0.6 from independent me
asurements of film stress and strain. Our results indicate that use of
the rule of mixtures to determine the strained-alloy elastic constant
s from the bulk values for pure Si and Ge is valid, and that higher-or
der elastic effects are relatively unimportant over this composition r
ange. (C) 1997 American Institute of Physics.