Yc. Chan et al., NONDESTRUCTIVE DETECTION OF DELAMINATIONS IN MULTILAYER CERAMIC CAPACITORS USING IMPROVED DIGITAL SPECKLE CORRELATION METHOD, Microwave and optical technology letters, 16(2), 1997, pp. 80-85
The use of an improved digital speckle correlation method (DSCM) was d
emonstrated for the in situ and nondestructive detection of delaminati
ons in layered-structure microcomponents such as multilayer ceramic ca
pacitors (MLCs) in surface-mount printed circuit board assemblies. The
delaminations in MLCs that contributed to thermal displacements on th
e MLC surface after electrical lending could be uniquely identified us
ing the improved DSCM; with the help of a double-lens arrangement. The
method was found to be very sensitive to tile thermal displacement of
the MLS surface after electrical loading A resolution of better than
20 nm in surface deformation measurements has been achieved within 0.0
1 pixel resolutions. The delamination in a MLC, as obtained by this me
thod, correlates well with destructive physical analyses performed on
the respective samples. (C) 1997 John Wiley & Sons, Inc.