SPECTROSCOPIC MEASUREMENTS OF THIN ORGANIC FILMS USING NEAR-FIELD SCANNING OPTICAL MICROSCOPY

We describe the modification of a commercially available near-field sc anning optical microscope, which uses an optical shear-force feedback technique to regulate probe/sample distance, for the purpose of invest igating thin organic films. The commercially installed 670 nm diode la ser used for feedback was replaced with a 980 nm diode laser. The repl acement of the 670 nm diode laser with a diode laser which emitted at a much longer wavelength allowed for unobstructed acquisition of the f luorescence spectra of a thin layer of poly (phenylene vinylene) and a dye-doped oxide film.