We have studied the Raman spectra of AlxGa1-xN layers grown by molecul
ar beam epitaxy on sapphire substrates. The aluminum content x of the
samples covered the whole composition range for x from 0 (GaN) to 1 (A
lN). The energy of the optical modes and the broadening of the Raman p
eaks are determined as a function of x. Both one and two-mode behavior
are simultaneously observed in the III-V semiconductor for different
phonon modes. While the energy of the A(1)(LO) phonon mode continuousl
y increases with increasing x (one-mode behavior), the E-2 phonon mode
presents two modes with energies that slowly increase with aluminum c
ontent. The frequencies of these modes are near those of pure GaN and
pure AIN, and their intensities and linewidths strongly depend on comp
osition. The behavior of the A(1)(TO) phonon mode could not be clearly
established. The broadening of the peaks shows a maximum for an alumi
num content around 80%, due to the increasing structural disorder of t
he alloy. (C) 1997 Elsevier Science Ltd.