VACUUM NEAR-FIELD SCANNING OPTICAL MICROSCOPE FOR VARIABLE CRYOGENIC TEMPERATURES

We describe the design of a novel near-held scanning optical microscop e for cryogenic temperatures and operation in vacuum. A helium flow cr yostat is used for active temperature control of the sample in the ran ge between 8 and 330 K, while all components of the near-field microsc ope are kept at room temperature. This design greatly simplifies near- field microscopy at variable sample temperatures and permits large pie zoelectric scan ranges of up to 100X100X10 mu m(3), the implementation of hardware-linearized piezoelectric scan stages, as well as flexible coarse positioning. First experiments with single GaAs quantum wires demonstrate the excellent performance of this new instrument. (C) 1997 American Institute of Physics.