A. Pullia et al., NEW RESULTS WITH SILICON PAD DETECTORS AND LOW-NOISE ELECTRONICS FOR ABSORPTION SPECTROMETRY, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 395(3), 1997, pp. 452-456
High-resistivity silicon diode detectors integrable in array structure
s have been tested for high-resolution X-ray spectroscopy at various t
emperatures. Using an inexpensive commercially available front-end tra
nsistor we have obtained resolutions of 19 electrons rms, or 165 eV FW
HM, at -35 degrees C and 39 electrons rms, or 320 eV FWHM, at 26 degre
es C, with 3 and 1 mu s shaping times. The obtained resolution values
are adequate for synchrotron light based EXAFS experiments. These reli
able detectors can be suitably employed for high-performance multichan
nel systems in which high-rate capability is achieved by using an arra
y of detectors operated in parallel. A 16-element detector prototype h
as been recently assembled, installed and successfully operated for a
real EXAFS experiment at NSLS.