JOINT DESIGN AND TEST CONSIDERATION IN HIGH-FREQUENCY CIRCUITS

Radiofrequency (RF) systems technology is continually pushing maximum operating frequencies upward. This constrains manufacturers of RF prod ucts to specify their circuits in terms of scattering parameters. inte grating design and test is one of the highly desirable analog systems requirements. In this paper a frequency domain analysis of RF systems is performed. This analysis is intended to ameliorate the design perfo rmances and to facilitate the test of a given product especially integ rated circuits. It helps a design engineer to determine parameters tha t influence the circuit performance and the best topology that can be used to help improve tills performance. On the other hand it helps a t est engineer to plan test strategy and to predict which elements can b e isolated by a given test set. By this analysis, we determine the cor relation between the different components in a circuit and their conjo int influence on the output. (C) 1997 John Wiley & Sons, Inc.