Sc. Cho et al., EXTENDED ADDITIONAL LAYER METHOD OF CALCULATING THE COUPLING COEFFICIENT OF ARBITRARILY-SHAPED GRATINGS, Microwave and optical technology letters, 16(3), 1997, pp. 143-145
The extended additional layer method (EALM) of calculating the couplin
g coefficient of arbitrarily shaped gratings is proposed To determine
the unperturbed field distributions, a grating region is replaced by a
new uniform layer whose dielectric constant is the average value of t
he dielectric constant of a grating region in both the longitudinal an
d transverse directions. The validity of this method is established by
comparing the results calculated by partitioning the grating region u
p to five uniform layers. (C) 1997 John Wiley & Sons Inc.