Authors:
FISKER R
POULSEN HF
SCHOU J
CARSTENSEN JM
GARBE S
Citation: R. Fisker et al., USE OF IMAGE-PROCESSING TOOLS FOR TEXTURE ANALYSIS OF HIGH-ENERGY X-RAY SYNCHROTRON DATA, Journal of applied crystallography, 31, 1998, pp. 647-653
Authors:
AMARA ABH
BENBRAHIM J
PLANCON A
BENRHAIEM H
Citation: Abh. Amara et al., X-RAY-DIFFRACTION OF HYDRATED AND DEHYDRATED NACRITE STACKING MODES, Journal of applied crystallography, 31, 1998, pp. 654-662
Authors:
SAITOW A
YOSHIKAWA A
HORIUCHI H
SHISHIDO T
FUKUDA T
TANAKA M
MORI T
SASAKI S
Citation: A. Saitow et al., STRUCTURAL-CHANGE CAUSED BY SUBSTITUTION OF ND FOR SM IN (ND, SM)ALO3- APPLICATION OF SYNCHROTRON HIGH-RESOLUTION POWDER X-RAY-DIFFRACTION, Journal of applied crystallography, 31, 1998, pp. 663-671
Authors:
TSURUTA H
BRENNAN S
REK ZU
IRVING TC
TOMPKINS WH
HODGSON KO
Citation: H. Tsuruta et al., A WIDE-BANDPASS MULTILAYER MONOCHROMATOR FOR BIOLOGICAL SMALL-ANGLE SCATTERING AND FIBER DIFFRACTION STUDIES, Journal of applied crystallography, 31, 1998, pp. 672-682
Citation: Hy. Lee et R. Freer, HIGH-ORDER INCOMMENSURATE MODULATIONS AND INCOMMENSURATE SUPERSTRUCTURES IN TRANSPARENT SR0.6BA0.4NB2O6 (SBN40) CERAMICS, Journal of applied crystallography, 31, 1998, pp. 683-691
Citation: Ie. Grey et al., ACCURATE SITE OCCUPANCIES FOR LIGHT-ATOMS FROM POWDER X-RAY DATA - OXYGEN VACANCY ORDERING IN 6H-BAFE0.67TI0.33O3-DELTA (DELTA = 0.08 AND 0.32), Journal of applied crystallography, 31, 1998, pp. 692-699
Citation: L. Seve et al., DETERMINATION OF THE ANOMALOUS SCATTERING FACTORS IN THE SOFT-X-RAY RANGE USING DIFFRACTION FROM A MULTILAYER, Journal of applied crystallography, 31, 1998, pp. 700-707
Citation: R. Bolotovsky et al., THE USE OF PARTIAL REFLECTIONS FOR SCALING AND AVERAGING X-RAY AREA DETECTOR DATA, Journal of applied crystallography, 31, 1998, pp. 708-717
Citation: Vl. Mazzocchi et Cbr. Parente, REFINEMENT OF THE FERRIMAGNETIC AND PARAMAGNETIC PHASES OF MAGNETITE FROM NEUTRON MULTIPLE DIFFRACTION DATA, Journal of applied crystallography, 31, 1998, pp. 718-725
Authors:
MEDRANO C
HEYROTH F
SCHLENKER M
BARUCHEL J
ESPESO J
Citation: C. Medrano et al., 2-BEAM AND 3-BEAM X-RAY-DIFFRACTION IMAGING OF DOMAINS IN MAGNETITE, Journal of applied crystallography, 31, 1998, pp. 726-732
Authors:
SALUD J
BARRIO M
LOPEZ DO
TAMARIT JL
ALCOBE X
Citation: J. Salud et al., ANISOTROPY OF INTERMOLECULAR INTERACTIONS FROM THE STUDY OF THE THERMAL-EXPANSION TENSOR, Journal of applied crystallography, 31, 1998, pp. 748-757
Authors:
SHOTTON MW
POPE LH
FORSYTH VT
DENNY RC
ARCHER J
LANGAN P
YE H
BOOTE C
Citation: Mw. Shotton et al., NEW DEVELOPMENTS IN INSTRUMENTATION FOR X-RAY AND NEUTRON FIBER DIFFRACTION EXPERIMENTS, Journal of applied crystallography, 31, 1998, pp. 758-766
Authors:
REVENANTBRIZARD C
SIMON JP
REGNARD JR
MANZINI I
RODMACQ B
Citation: C. Revenantbrizard et al., STRUCTURAL EVOLUTION OF AG-CO AND AG-NI ALLOYS STUDIED BY ANOMALOUS SMALL-ANGLE X-RAY-SCATTERING, Journal of applied crystallography, 31, 1998, pp. 783-788
Citation: K. Burger et al., THE APPLICATION OF RESONANT SCATTERING TECHNIQUES TO AB-INITIO STRUCTURE SOLUTION FROM POWDER DATA USING SRSO4 AS A TEST-CASE, Journal of applied crystallography, 31, 1998, pp. 789-797
Citation: Lm. Rice et al., PHASE IMPROVEMENT BY MULTI-START SIMULATED ANNEALING REFINEMENT AND STRUCTURE-FACTOR AVERAGING, Journal of applied crystallography, 31, 1998, pp. 798-805
Citation: Pw. Li et Rc. Bi, APPLICATIONS OF POLYCAPILLARY X-RAY OPTICS IN PROTEIN CRYSTALLOGRAPHY, Journal of applied crystallography, 31, 1998, pp. 806-811
Citation: K. Djinoviccarugo et al., A CELL FOR PRODUCING XENON-DERIVATIVE CRYSTALS FOR CRYOCRYSTALLOGRAPHIC ANALYSIS, Journal of applied crystallography, 31, 1998, pp. 812-814
Authors:
HARDIE MJ
KIRSCHBAUM K
MARTIN A
PINKERTON AA
Citation: Mj. Hardie et al., AN OPEN-FLOW HELIUM CRYOSTAT FOR SINGLE-CRYSTAL X-RAY-DIFFRACTION EXPERIMENTS, Journal of applied crystallography, 31, 1998, pp. 815-817
Citation: Wm. Vetter et M. Dudley, HARMONIC COMPOSITION OF SYNCHROTRON WHITE-BEAM X-RAY TOPOGRAPHIC BACK-REFLECTION IMAGES OF BASAL-CUT SILICON-CARBIDE SINGLE-CRYSTAL WAFERS, Journal of applied crystallography, 31, 1998, pp. 820-822
Authors:
BERGSTROM O
ANDERSSON AM
EDSTROM K
GUSTAFSSON T
Citation: O. Bergstrom et al., A NEUTRON-DIFFRACTION CELL FOR STUDYING LITHIUM-INSERTION PROCESSES IN ELECTRODE MATERIALS, Journal of applied crystallography, 31, 1998, pp. 823-825