DETERMINATION OF THE ANOMALOUS SCATTERING FACTORS IN THE SOFT-X-RAY RANGE USING DIFFRACTION FROM A MULTILAYER

Bragg diffraction from an Ag/Ni multilayer was used to determine indep endently both the real and imaginary parts of the anomalous scattering factor (ASF) around the Ni L-III and L-II edges in the soft-X-ray ran ge. Huge resonant variations were observed with f '' reaching 55 r(0) and f' decreasing to -63 r(0) at the Ni L-III edge. The independent me asurements of f' and f '' are tested for coherency using the Kramers-K ronig relation. The f '' values are also compared with those derived f rom X-ray absorption methods such as total electron yield and fluoresc ence yield measurements.