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Results: 126-150/334
Authors:
GILFRICH J
Citation: J. Gilfrich, AN X-RAY-ANALYSIS SOCIETY, X-ray spectrometry, 25(6), 1996, pp. 263-264
Authors:
CAZAUX J
Citation: J. Cazaux, ELECTRON-PROBE MICROANALYSIS OF INSULATING MATERIALS - QUANTIFICATIONPROBLEMS AND SOME POSSIBLE SOLUTIONS, X-ray spectrometry, 25(6), 1996, pp. 265-280
Authors:
YU KN
MIAO JM
Citation: Kn. Yu et Jm. Miao, NONDESTRUCTIVE ANALYSIS OF JINGDEZHEN BLUE AND WHITE PORCELAINS OF THE MING DYNASTY USING EDXRF, X-ray spectrometry, 25(6), 1996, pp. 281-285
Authors:
SCOTT VD
LOVE G
Citation: Vd. Scott et G. Love, STUDY OF MICROSCALE CHEMICAL-REACTIONS USING ELECTRON-INDUCED LONG-WAVELENGTH X-RAYS, X-ray spectrometry, 25(6), 1996, pp. 286-294
Authors:
REBOHLE L
LEHNERT U
ZSCHORNACK G
Citation: L. Rebohle et al., K-BETA K-ALPHA INTENSITY RATIOS AND CHEMICAL EFFECTS OF SOME 3D ELEMENTS/, X-ray spectrometry, 25(6), 1996, pp. 295-300
Authors:
GILFRICH J
Citation: J. Gilfrich, X-RAY VENDORS, X-ray spectrometry, 25(5), 1996, pp. 203-203
Authors:
SHARMA IG
BOSE DK
JOSEPH D
LAL M
Citation: Ig. Sharma et al., ELEMENTAL ANALYSIS BY RADIOISOTOPE-EXCITED XRF DURING THERMIT SMELTING OF FERROVANADIUM AND NIOBIUM, X-ray spectrometry, 25(5), 1996, pp. 205-209
Authors:
FINKELSHTEIN AL
AFONIN VP
Citation: Al. Finkelshtein et Vp. Afonin, ANALYTICAL APPROXIMATION FOR CALCULATING SECONDARY FLUORESCENCE IN X-RAY-FLUORESCENCE ANALYSIS OF POWDERED MATERIALS, X-ray spectrometry, 25(5), 1996, pp. 210-214
Authors:
HONKIMAKI V
HAMALAINEN K
MANNINEN S
Citation: V. Honkimaki et al., QUANTITATIVE X-RAY-FLUORESCENCE ANALYSIS USING FUNDAMENTAL PARAMETERS- APPLICATION TO GOLD JEWELRY, X-ray spectrometry, 25(5), 1996, pp. 215-220
Authors:
MASI AN
OLSINA RA
Citation: An. Masi et Ra. Olsina, PREPARATION OF THIN-FILMS WITH LOADED RESINS FOR THE PRECONCENTRATIONAND DETERMINATION OF RARE-EARTH ELEMENTS BY X-RAY-FLUORESCENCE SPECTROSCOPY, X-ray spectrometry, 25(5), 1996, pp. 221-224
Authors:
ALKOFAHI MM
HALLAK AB
Citation: Mm. Alkofahi et Ab. Hallak, ANALYSIS OF KIDNEY-STONES BY PIXE AND RBS TECHNIQUES, X-ray spectrometry, 25(5), 1996, pp. 225-228
Authors:
BENHAYOUNE H
JBARA O
Citation: H. Benhayoune et O. Jbara, SOME EXPERIMENTAL-EVIDENCE FOR THE PHI(0) VARIATION IN EPMA OF INSULATING MATERIALS, X-ray spectrometry, 25(5), 1996, pp. 229-232
Authors:
ALLAWADHI KL
SOOD BS
MITTAL R
SINGH N
SHARMA JK
Citation: Kl. Allawadhi et al., INVESTIGATION OF THE EFFECT OF COSTER-KRONIG TRANSITIONS AND INCIDENTPHOTON ENERGY ON AVERAGE L-SHELL FLUORESCENCE YIELDS, X-ray spectrometry, 25(5), 1996, pp. 233-238
Authors:
SHARMA JK
SINGH N
MITTAL R
SOOD BS
ALLAWADHI KL
Citation: Jk. Sharma et al., CHOICE BETWEEN THE USE OF EXPERIMENTAL AND THEORETICAL VALUES OF L-SUBSHELL X-RAY-FLUORESCENCE CROSS-SECTIONS FOR VARIOUS APPLICATIONS, X-ray spectrometry, 25(5), 1996, pp. 239-244
Authors:
WANG YZ
Citation: Yz. Wang, DIRECT DETERMINATION METHOD FOR HOMOGENEOUS SOLID SAMPLES IN X-RAY-FLUORESCENCE ANALYSIS, X-ray spectrometry, 25(5), 1996, pp. 245-257
Authors:
GILFRICH J
Citation: J. Gilfrich, XRF INSTRUMENTATION, X-ray spectrometry, 25(4), 1996, pp. 145-145
Authors:
KUCZUMOW A
LARSSON S
RINDBY A
Citation: A. Kuczumow et al., ANALYSIS OF THE DISTRIBUTION OF INORGANIC COMPONENTS OF WOOD BY X-RAYCAPILLARY MICROPROBE, X-ray spectrometry, 25(4), 1996, pp. 147-155
Authors:
KLOCKENKAMPER R
VONBOHLEN A
Citation: R. Klockenkamper et A. Vonbohlen, ELEMENTAL ANALYSIS OF ENVIRONMENTAL-SAMPLES BY TOTAL-REFLECTION X-RAY-FLUORESCENCE - A REVIEW, X-ray spectrometry, 25(4), 1996, pp. 156-162
Authors:
KEKRE PA
JOSHI KP
MISHRA A
CHATURVEDI KK
Citation: Pa. Kekre et al., X-RAY-ABSORPTION FINE-STRUCTURE STUDIES OF SOME COBALT(II) COMPLEXES, X-ray spectrometry, 25(4), 1996, pp. 163-166
Authors:
OSAN J
TOROK S
TOROK K
NEMETH L
LABAR JL
Citation: J. Osan et al., PHYSIOLOGICAL EFFECT OF ACCIDENTAL FLY-ASH DEPOSITION ON PLANTS AND CHEMICAL STUDY OF THE DUSTED PLANT-LEAVES BY XRP AND EPMA, X-ray spectrometry, 25(4), 1996, pp. 167-172
Authors:
WATSON JS
Citation: Js. Watson, PAST, SIMPLE METHOD OF POWDER PELLET PREPARATION FOR X-RAY-FLUORESCENCE ANALYSIS, X-ray spectrometry, 25(4), 1996, pp. 173-174
Authors:
CHEBURKIN AK
SHOTYK W
Citation: Ak. Cheburkin et W. Shotyk, DOUBLE-PLATE SAMPLE CARRIER FOR A SIMPLE TOTAL-REFLECTION X-RAY-FLUORESCENCE ANALYZER, X-ray spectrometry, 25(4), 1996, pp. 175-178
Authors:
ROUSSEAU RM
WILLIS JP
DUNCAN AR
Citation: Rm. Rousseau et al., PRACTICAL XRF CALIBRATION PROCEDURES FOR MAJOR AND TRACE-ELEMENTS, X-ray spectrometry, 25(4), 1996, pp. 179-189
Authors:
MAINARDI RT
BARREA RA
Citation: Rt. Mainardi et Ra. Barrea, INDIRECT METHOD OF X-RAY-SPECTRA DETERMINATION BY XRF, X-ray spectrometry, 25(4), 1996, pp. 190-195
Authors:
GILFRICH J
Citation: J. Gilfrich, UNTITLED, X-ray spectrometry, 25(3), 1996, pp. 101-101