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Results: 1-25/383
Authors:
KRAMM KU
Citation: Ku. Kramm, VISCOSITY MEASUREMENT WITH LONGITUDINAL VIBRATIONS, TM. Technisches Messen, 65(9), 1998, pp. 303-307
Authors:
MOLITOR M
KLAEGER S
Citation: M. Molitor et S. Klaeger, PROCESS OPTIMIZATION BY DIAMETER CONTROL - FLUID-COUPLED DIAMETER MEASUREMENT EQUIPMENT FOR LATHES, TM. Technisches Messen, 65(9), 1998, pp. 308-312
Authors:
LINK A
VONMARTENS HJ
WABINSKI W
Citation: A. Link et al., IDENTIFICATION OF ACCELEROMETERS BY SHOCK PULSE EXCITATION (PART 1), TM. Technisches Messen, 65(9), 1998, pp. 313-318
Authors:
FROHLICH T
BLUMRODER G
Citation: T. Frohlich et G. Blumroder, DETERMINING THE RATIO OF THE TIME CONSTANTS OF 2 FIRST-ORDER ELEMENTSFROM THE DIFFERENCES OF THE STEP RESPONSES, TM. Technisches Messen, 65(9), 1998, pp. 319-321
Authors:
PICHLER P
Citation: P. Pichler, INFLUENCE OF ERRORS CONCERNING MILLING INVOLVING 5 AXES - MILLING CUTTERS ON MACHINES WHOSE SWIVEL AXES ARE 45-DEGREES TO THE Y-Z PLANE, TM. Technisches Messen, 65(9), 1998, pp. 322-327
Authors:
WAGNER E
Citation: E. Wagner, OPTICS AND PHOTONICS, GROWTH INDUSTRIES, TM. Technisches Messen, 65(7-8), 1998, pp. 259-259
Authors:
SEIB M
SHAFER R
LAUINGER N
Citation: M. Seib et al., A PASSIVE MULTICHANNEL 3D RANGE SENSOR USING THE PUPIL DIVISION AND TEMPORAL PHASE MEASUREMENT METHOD, TM. Technisches Messen, 65(7-8), 1998, pp. 260-263
Authors:
SCHWARTE R
HEINOL HG
BUXBAUM B
XU ZP
RINGBECK T
ZHANG ZG
TAI W
HARTMANN K
KLEUVER W
LUAN XM
Citation: R. Schwarte et al., NOVEL 3D-VISION SYSTEMS BASED ON LAYOUT OPTIMIZED PMD-STRUCTURES, TM. Technisches Messen, 65(7-8), 1998, pp. 264-271
Authors:
HUHNKE B
Citation: B. Huhnke, OPTICAL METHODS FOR IN-PROCESS ROUGHNESS MEASUREMENT OF ROTATIONALLY SYMMETRICAL WORKPIECES, TM. Technisches Messen, 65(7-8), 1998, pp. 272-279
Authors:
WAGEMANN EU
TIZIANI HJ
Citation: Eu. Wagemann et Hj. Tiziani, REAL-TIME DEFECT DETECTION IN VIDEO IMAGES, TM. Technisches Messen, 65(7-8), 1998, pp. 280-287
Authors:
LEOPOLD J
GUNTHER H
Citation: J. Leopold et H. Gunther, FAST CHARACTERIZATION OF GLOSSY SURFACES BY MEANS OF COHERENT RADIATION, TM. Technisches Messen, 65(7-8), 1998, pp. 288-292
Authors:
VOGT F
TACKE M
WAGNER E
Citation: F. Vogt et al., UV-SPECTROSCOPIC ANALYSIS OF WATER FOR AROMATIC-HYDROCARBONS, TM. Technisches Messen, 65(7-8), 1998, pp. 293-296
Authors:
TROSS C
KOHL CD
SCHRAUDNER J
Citation: C. Tross et al., THERMAL LEVEL MEASURING METHOD FOR LIQUID AGENTS IN CLOSED METAL TANKS, TM. Technisches Messen, 65(6), 1998, pp. 215-223
Authors:
POPPEN G
HANS V
Citation: G. Poppen et V. Hans, FLOW MEASUREMENT ON THE BASIS OF CROSS-CO RRELATED ULTRASOUND SIGNALS, TM. Technisches Messen, 65(6), 1998, pp. 224-228
Authors:
FRITSCH H
IWERT T
MIKUTA R
HAUPTMANN P
PEINER E
SCHLACHETZKI A
Citation: H. Fritsch et al., RESONANT MICROMECHANICAL VIBRATION SENSOR S FOR ONLINE MONITORING ANDDIAGNOSIS OF BEARINGS, TM. Technisches Messen, 65(6), 1998, pp. 229-235
Authors:
BUTTNER U
NAKLADAL A
PESCHKA A
GERLACH G
Citation: U. Buttner et al., CALIBRATION AND ERROR COMPENSATION OF PIE ZORESISTIVE PRESSURE SENSORS, TM. Technisches Messen, 65(6), 1998, pp. 236-243
Authors:
QU WM
WENZEL C
JAHN A
ZEIDLER D
URBANSKY N
Citation: Wm. Qu et al., 3-DIMENSIONAL CHIP-ACCELEROMETER, TM. Technisches Messen, 65(6), 1998, pp. 244-251
Authors:
SCHMITZ B
WALTHER HG
Citation: B. Schmitz et Hg. Walther, MEASUREMENT TECHNOLOGY USING THERMAL WAVE S, TM. Technisches Messen, 65(5), 1998, pp. 175-176
Authors:
SCHMITZ B
GEERKENS J
SEIDEL U
GOCH G
Citation: B. Schmitz et al., FUNDAMENTALS OF PHOTOTHERMAL MEASUREMENTS FOR NONDESTRUCTIVE TESTING, TM. Technisches Messen, 65(5), 1998, pp. 177-184
Authors:
WALTHER HG
LAN TTN
Citation: Hg. Walther et Ttn. Lan, HARDNESS DEPTH PROFILING IN STEEL BY PHOT OTHERMAL TESTING, TM. Technisches Messen, 65(5), 1998, pp. 185-191
Authors:
NETZELMANN U
ZHANG HJ
Citation: U. Netzelmann et Hj. Zhang, APPLICATION OF THERMAL-WAVE TECHNIQUES FO R CHARACTERIZATION OF CERAMICS, TM. Technisches Messen, 65(5), 1998, pp. 192-196
Authors:
PELZL J
KAACK M
Citation: J. Pelzl et M. Kaack, LOCALLY AND DEPTH RESOLVED CHARACTERIZATI ON OF MAGNETIC MATERIAL PROPERTIES USING PHOTOTHERMAL TECHNIQUES, TM. Technisches Messen, 65(5), 1998, pp. 197-203
Authors:
SEIDEL U
WALTHER HG
Citation: U. Seidel et Hg. Walther, QUANTITATIVE CHARACTERIZATION OF SUBSURFA CE INHOMOGENEITIES BY THERMAL WAVES, TM. Technisches Messen, 65(5), 1998, pp. 204-210
Authors:
SCHUHMANN R
THONISS T
Citation: R. Schuhmann et T. Thoniss, TELECENTRIC SYSTEMS FOR OPTICAL MEASUREME NT AND TESTING, TM. Technisches Messen, 65(4), 1998, pp. 131-136
Authors:
FAULSTICH A
Citation: A. Faulstich, OPTICAL-TESTING USING WAVE-FRONT SENSORS, TM. Technisches Messen, 65(4), 1998, pp. 137-141