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Results:
1-12
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Results: 12
Authors:
Malacara-Hernandez, D
Citation: D. Malacara-hernandez, Optics for engineers, T APPL PHYS, 77, 2000, pp. 1-32
Authors:
Asundi, A
Citation: A. Asundi, Introduction to engineering mechanics, T APPL PHYS, 77, 2000, pp. 33-54
Authors:
Surrel, Y
Citation: Y. Surrel, Fringe analysis, T APPL PHYS, 77, 2000, pp. 55-102
Authors:
Rastogi, PK
Citation: Pk. Rastogi, Principles of holographic interferometry and speckle metrology, T APPL PHYS, 77, 2000, pp. 103-150
Authors:
Post, D
Han, BT
Ifju, PG
Citation: D. Post et al., Moire methods for engineering and science - Moire interferometry and shadow Moire, T APPL PHYS, 77, 2000, pp. 151-196
Authors:
Chen, TY
Citation: Ty. Chen, Digital photoelasticity, T APPL PHYS, 77, 2000, pp. 197-232
Authors:
Sirkis, JS
Citation: Js. Sirkis, Optical fiber strain sensing in engineering mechanics, T APPL PHYS, 77, 2000, pp. 233-272
Authors:
Inaudi, D
Citation: D. Inaudi, Long-gage fiber-optic sensors for structural monitoring, T APPL PHYS, 77, 2000, pp. 273-293
Authors:
Krishnaswamy, S
Citation: S. Krishnaswamy, Techniques for non-birefringent objects: Coherent shearing interferometry and caustics, T APPL PHYS, 77, 2000, pp. 295-321
Authors:
Sutton, MA
McNeill, SR
Helm, JD
Chao, YJ
Citation: Ma. Sutton et al., Advances in two-dimensional and three-dimensional computer vision, T APPL PHYS, 77, 2000, pp. 323-372
Authors:
Coupland, JM
Citation: Jm. Coupland, Laser Doppler and pulsed laser velocimetry in fluid mechanics, T APPL PHYS, 77, 2000, pp. 373-412
Authors:
Whitehouse, DJ
Citation: Dj. Whitehouse, Surface characterization and roughness measurement in engineering, T APPL PHYS, 77, 2000, pp. 413-461
Risultati:
1-12
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