Authors:
EARLY E
THOMPSON A
JOHNSON C
DELUISI J
DISTERHOFT P
WARDLE D
WU E
MOU WF
EHRAMJIAN J
TUSSON J
MESTECHKINA T
BEAUBIAN M
GIBSON J
HAYES D
Citation: E. Early et al., THE 1996 NORTH-AMERICAN INTERAGENCY INTERCOMPARISON OF ULTRAVIOLET MONITORING SPECTRORADIOMETERS, Journal of research of the National Institute of Standards and Technology, 103(5), 1998, pp. 449-482
Citation: Nc. Das et al., IMAGE EVALUATION OF THE HIGH-RESOLUTION VUV SPECTROMETER AT SURF-II BY RAY-TRACING, Journal of research of the National Institute of Standards and Technology, 103(5), 1998, pp. 483-495
Citation: Kd. Mielenz, ALGORITHMS FOR FRESNEL DIFFRACTION AT RECTANGULAR AND CIRCULAR APERTURES, Journal of research of the National Institute of Standards and Technology, 103(5), 1998, pp. 497-509
Authors:
EICHMILLER FC
HOFFMAN KM
GUISEPPETTI AA
WRAY MM
AVERS RJ
Citation: Fc. Eichmiller et al., ACID-ASSISTED CONSOLIDATION OF SILVER ALLOYS FOR DIRECT FILLINGS, Journal of research of the National Institute of Standards and Technology, 103(5), 1998, pp. 511-516
Citation: NISTS OPEN-ARCHITECTURE CONTROLLER SEALS THE DEAL BETWEEN 2 SMALL MACHINE SHOPS, Journal of research of the National Institute of Standards and Technology, 103(5), 1998, pp. 539-539
Citation: REFRIGERANT PROPERTIES DATABASE RELEASED, Journal of research of the National Institute of Standards and Technology, 103(5), 1998, pp. 540-541
Citation: NISTS CRYPTOGRAPHIC MODULE VALIDATIONS APPROACH 20, Journal of research of the National Institute of Standards and Technology, 103(5), 1998, pp. 540-540
Citation: NIST RESEARCHER SPEARHEADS DEVELOPMENT OF FIRST FLAT-PANEL DISPLAY MEASUREMENT STANDARD, Journal of research of the National Institute of Standards and Technology, 103(5), 1998, pp. 540-540
Citation: FIRE EXPERIMENTS IN A 13-STORY BUILDING, Journal of research of the National Institute of Standards and Technology, 103(5), 1998, pp. 541-541
Citation: QUALITY ASSURANCE STANDARDS FOR FORENSIC DNA TESTING LABORATORIES, Journal of research of the National Institute of Standards and Technology, 103(5), 1998, pp. 541-541
Citation: NIST MEASUREMENTS HELP INDUSTRY GROW BETTER CRYSTALS FOR RADIATION DETECTION APPLICATION, Journal of research of the National Institute of Standards and Technology, 103(5), 1998, pp. 541-542
Citation: NIST CONTRIBUTION ADDS 50-PERCENT MORE DATA TO CRYSTALLOGRAPHIC INFORMATION FILE, Journal of research of the National Institute of Standards and Technology, 103(5), 1998, pp. 542-542
Citation: BETA VERSION DEVELOPED OF COMPLIANCE TEST SOFTWARE REQUESTED BY IPC, Journal of research of the National Institute of Standards and Technology, 103(5), 1998, pp. 542-543
Citation: NIST SCIENTIST DEVELOPS NEW STANDARD FOR ASSESSING RELIABILITY OF ELECTRICAL INTERCONNECTS IN INTEGRATED-CIRCUITS, Journal of research of the National Institute of Standards and Technology, 103(5), 1998, pp. 543-543
Citation: NEW LABORATORY MEASURES CRITICAL DATA FOR SEMICONDUCTOR INDUSTRY, Journal of research of the National Institute of Standards and Technology, 103(5), 1998, pp. 543-543
Citation: WORKSHOP HELD ON LEGAL METROLOGY FOR THE AMERICA, Journal of research of the National Institute of Standards and Technology, 103(5), 1998, pp. 543-544
Citation: NIST MICROTENSILE TEST APPARATUS DUPLICATED AT PRIVATE COMPANY, Journal of research of the National Institute of Standards and Technology, 103(5), 1998, pp. 544-544
Citation: 4TH JOINT INDUSTRIAL-ACADEMIC-NIST WORKSHOP HELD ON MACHINE-TOOL PERFORMANCE MODELS AND DATA REPOSITORY, Journal of research of the National Institute of Standards and Technology, 103(5), 1998, pp. 544-544
Citation: GOVERNMENT INDUSTRY SUPPORT FOR SYNCHRONIZED MULTIMEDIA INTEGRATION LANGUAGE (SMIL) TO BRING TELEVISION-LIKE CONTENT TO THE WEB/, Journal of research of the National Institute of Standards and Technology, 103(5), 1998, pp. 544-545
Citation: NIST CONTRIBUTES TO THE SPECIFICATIONS OF THE ISO IEC MPEG2 PART 10 STANDARD, DSM-CC CONFORMANCE TEST/, Journal of research of the National Institute of Standards and Technology, 103(5), 1998, pp. 545-545
Citation: SMALLER MANUFACTURERS - SWAT THE MILLENNIUM BUG WITH SELF-HELP TOOL, Journal of research of the National Institute of Standards and Technology, 103(5), 1998, pp. 545-546
Citation: SEM MONITOR WINS RESEARCH-AND-DEVELOPMENT 100, Journal of research of the National Institute of Standards and Technology, 103(5), 1998, pp. 545-545
Citation: NEW STANDARD HELPS COMPUTER MAKERS ASSESS FLAT-PANEL QUALITY, Journal of research of the National Institute of Standards and Technology, 103(5), 1998, pp. 546-546
Citation: FEDERAL STATE-STUDY FINDS 19 PERCENT OF MILK CONTAINERS SHORT/, Journal of research of the National Institute of Standards and Technology, 103(5), 1998, pp. 546-547