AAAAAA
Results: 1-25/388
Authors:
Szoplik, T
Nakwaski, W
Citation: T. Szoplik et W. Nakwaski, Editorial, OPT APPL, 31(2), 2001, pp. 265-266
Authors:
Bugajski, M
Reginski, K
Mroziewicz, B
Kubica, JM
Sajewicz, P
Piwonski, T
Zbroszczyk, M
Citation: M. Bugajski et al., High-performance 980-nm strained-layer InGaAs/GaAs quantum-well lasers, OPT APPL, 31(2), 2001, pp. 267-271
Authors:
Bugajski, M
Muszalski, J
Mroziewicz, B
Reginski, K
Ochalski, TJ
Citation: M. Bugajski et al., Resonant cavity enhanced photonic devices, OPT APPL, 31(2), 2001, pp. 273-288
Authors:
Nakwaski, W
Mackowiak, P
Osinski, M
Citation: W. Nakwaski et al., Modelling of radial steam oxidation of AlAs layers in cylindrically symmetric mesa structures of vertical-cavity surface-emitting lasers, OPT APPL, 31(2), 2001, pp. 289-299
Authors:
Czyszanowski, T
Citation: T. Czyszanowski, Operation of arsenide diode lasers at elevated temperatures, OPT APPL, 31(2), 2001, pp. 301-311
Design considerations for GaAs/(AlGa)As SCH and GRIN-SCH quantum-well laser structures. 1. The model
Authors:
Czyszanowski, T
Wasiak, M
Nakwaski, W
Citation: T. Czyszanowski et al., Design considerations for GaAs/(AlGa)As SCH and GRIN-SCH quantum-well laser structures. 1. The model, OPT APPL, 31(2), 2001, pp. 313-323
Authors:
Czyszanowski, T
Wasiak, M
Nakwaski, W
Citation: T. Czyszanowski et al., Design considerations for GaAs/(AlGa)As SCH and GRIN-SCH quantum-well laser structures. II. The results, OPT APPL, 31(2), 2001, pp. 325-336
Authors:
Nakwaski, W
Mackowiak, P
Citation: W. Nakwaski et P. Mackowiak, Crucial structure elements of possible nitride vertical-cavity surface-emitting lasers, OPT APPL, 31(2), 2001, pp. 337-349
Authors:
Szczepanski, P
Tarasiuk, S
Citation: P. Szczepanski et S. Tarasiuk, Selectivity properties of circular grating DFB/DBR lasers with phase shift, OPT APPL, 31(2), 2001, pp. 351-371
Authors:
Kaczmarek, F
Citation: F. Kaczmarek, Laser diode pumping of an upconversion laser, OPT APPL, 31(2), 2001, pp. 373
Authors:
Augusciuk, E
Roszko, M
Citation: E. Augusciuk et M. Roszko, Application of planar monomode waveguides to determine parameters of thin active layers used in waveguide sensors, OPT APPL, 31(2), 2001, pp. 377-383
Authors:
Wolinski, TR
Konopka, W
Domanski, AW
Citation: Tr. Wolinski et al., Polarimetric optical fiber sensors for hydrostatic pressure and dynamic strain measurement, OPT APPL, 31(2), 2001, pp. 385
Authors:
Jaroszewicz, LR
Citation: Lr. Jaroszewicz, Polarisation behaviour of different fiber-optic interferometer configurations under temperature changes, OPT APPL, 31(2), 2001, pp. 399-423
Authors:
Romaniuk, RS
Citation: Rs. Romaniuk, Manufacturing and characterization of ring-index optical fibers, OPT APPL, 31(2), 2001, pp. 425-444
Authors:
Sahraoui, B
Derkowska, B
Kryza, A
Kityk, IV
Citation: B. Sahraoui et al., The IR photoinduced changes in the Y-Ba-Cu-O thin films, OPT APPL, 31(2), 2001, pp. 445-451
Authors:
Buczynski, R
Szoplik, T
Jankowski, S
Veretennicoff, I
Thienpont, H
Citation: R. Buczynski et al., Functional properties of dual-rail photonic image processor using comparator arrays, OPT APPL, 31(2), 2001, pp. 453-465
Authors:
Kasztelanic, R
Mrozowicz, M
Citation: R. Kasztelanic et M. Mrozowicz, Optoelectronic module for thresholding and binarisation operation, OPT APPL, 31(2), 2001, pp. 467-478
Authors:
Siuzdak, J
Nowak, R
Czarnecki, T
Citation: J. Siuzdak et al., Homodyne chopper for weak optical signal detection, OPT APPL, 31(2), 2001, pp. 479-487
Authors:
Rajkowski, B
Nowak, P
Citation: B. Rajkowski et P. Nowak, Modelling of edge effects taking account of the diffusion phenomenon, OPT APPL, 31(2), 2001, pp. 489-498
Authors:
Latacz, L
Nowak, P
Citation: L. Latacz et P. Nowak, Model examination of the reflex-halation in single-layer light-sensitive system, OPT APPL, 31(2), 2001, pp. 499-506
Authors:
Dobierzewska-Mozrzymas, E
Citation: E. Dobierzewska-mozrzymas, Untitled, OPT APPL, 31(1), 2001, pp. 3-3
Authors:
Wiktorczyk, T
Citation: T. Wiktorczyk, Rare earth oxide films: their preparation and characterization, OPT APPL, 31(1), 2001, pp. 5-33
Authors:
Zukowska, K
Oleszkiewicz, E
Citation: K. Zukowska et E. Oleszkiewicz, Ellipsometry in optical studies of thin films conducted at the Institute of Physics of Wroclaw University of Technology, OPT APPL, 31(1), 2001, pp. 35-51
Authors:
Dobierzewska-Mozrzymas, E
Bieganski, P
Pieciul, E
Citation: E. Dobierzewska-mozrzymas et al., Discontinuous metal films on dielectric substrates, their optical and electrical properties, structures and statistical descriptions, OPT APPL, 31(1), 2001, pp. 53-81
Authors:
Wiktorczyk, T
Citation: T. Wiktorczyk, Optical properties of electron beam deposited lutetium oxide thin films, OPT APPL, 31(1), 2001, pp. 83-92