AAAAAA

   
Results: 1-13 |
Results: 13
PROGRESSIVE PATTERN-RECOGNITION USING THE WAVELET TRANSFORM
Authors: DECUSATIS C ABBATE A DAS P
Citation: C. Decusatis et al., PROGRESSIVE PATTERN-RECOGNITION USING THE WAVELET TRANSFORM, International journal of optoelectronics, 11(6), 1997, pp. 425-432
SIGNAL-DETECTION AND NOISE SUPPRESSION USING A WAVELET TRANSFORM SIGNAL PROCESSOR - APPLICATION TO ULTRASONIC FLAW DETECTION
Authors: ABBATE A KOAY J FRANKEL J SCHROEDER SC DAS P
Citation: A. Abbate et al., SIGNAL-DETECTION AND NOISE SUPPRESSION USING A WAVELET TRANSFORM SIGNAL PROCESSOR - APPLICATION TO ULTRASONIC FLAW DETECTION, IEEE transactions on ultrasonics, ferroelectrics, and frequency control, 44(1), 1997, pp. 14-26
APPLICATION OF LASER-INDUCED PHOTOCHARGE VOLTAGE SPECTROSCOPY IN SEMICONDUCTOR TESTING
Authors: PARK NC ABBATE A PALMA F DAS P
Citation: Nc. Park et al., APPLICATION OF LASER-INDUCED PHOTOCHARGE VOLTAGE SPECTROSCOPY IN SEMICONDUCTOR TESTING, Microelectronic engineering, 31(1-4), 1996, pp. 227-234
ACOUSTOELECTRIC CHARGE INJECTION IN SEMICONDUCTORS
Authors: OSTROVSKII IV ABBATE A HAN KJ DAS PK
Citation: Iv. Ostrovskii et al., ACOUSTOELECTRIC CHARGE INJECTION IN SEMICONDUCTORS, IEEE transactions on ultrasonics, ferroelectrics, and frequency control, 42(5), 1995, pp. 876-882
TRANSIENT ACOUSTOELECTRIC SPECTROSCOPY MEASUREMENTS FOR THE CHARACTERIZATION OF GAAS EPILAYER STRUCTURES
Authors: ABBATE A OSTROVSKII IV HAN KJ MASINI G PALMA F DAS P
Citation: A. Abbate et al., TRANSIENT ACOUSTOELECTRIC SPECTROSCOPY MEASUREMENTS FOR THE CHARACTERIZATION OF GAAS EPILAYER STRUCTURES, Semiconductor science and technology, 10(7), 1995, pp. 965-969
SURFACE PHOTO-CHARGE EFFECT IN SOLIDS
Authors: IVANOV O MIHAILOV V PUSTOVOIT VI ABBATE A DAS P
Citation: O. Ivanov et al., SURFACE PHOTO-CHARGE EFFECT IN SOLIDS, Optics communications, 113(4-6), 1995, pp. 509-512
EQUATION OF STATE OF ALUMINUM NITRIDE AND ITS SHOCK RESPONSE [J-APPL-PHYS 78, 5854 (1995)] - REPLY
Authors: DANDEKAR DP ABBATE A FRANKEL J
Citation: Dp. Dandekar et al., EQUATION OF STATE OF ALUMINUM NITRIDE AND ITS SHOCK RESPONSE [J-APPL-PHYS 78, 5854 (1995)] - REPLY, Journal of applied physics, 78(9), 1995, pp. 5857-5858
EQUATION OF STATE OF ALUMINUM NITRIDE AND ITS SHOCK RESPONSE
Authors: DANDEKAR DP ABBATE A FRANKEL J
Citation: Dp. Dandekar et al., EQUATION OF STATE OF ALUMINUM NITRIDE AND ITS SHOCK RESPONSE, Journal of applied physics, 76(7), 1994, pp. 4077-4085
ONLINE DETERMINATION OF CHROMIUM THICKNESS DURING PLATING
Authors: ABBATE A FRANKEL J DOXBECK M
Citation: A. Abbate et al., ONLINE DETERMINATION OF CHROMIUM THICKNESS DURING PLATING, Plating and surface finishing, 80(2), 1993, pp. 57-61
INVESTIGATION OF THE ROLE OF ZNSE FILMS ON GAAS USING ACOUSTOELECTRICVOLTAGE SPECTROSCOPY
Authors: HAN KJ ABBATE A BHAT IB AKRAM S DAS P
Citation: Kj. Han et al., INVESTIGATION OF THE ROLE OF ZNSE FILMS ON GAAS USING ACOUSTOELECTRICVOLTAGE SPECTROSCOPY, Journal of applied physics, 74(1), 1993, pp. 364-369
A TECHNIQUE FOR PROFILING THE EPILAYER CHANNEL OF SURFACE-ACOUSTIC-WAVE DEVICES ON PIEZOELECTRIC SEMICONDUCTORS
Authors: ABBATE A HAN KJ DAS P
Citation: A. Abbate et al., A TECHNIQUE FOR PROFILING THE EPILAYER CHANNEL OF SURFACE-ACOUSTIC-WAVE DEVICES ON PIEZOELECTRIC SEMICONDUCTORS, I.E.E.E. transactions on electron devices, 40(10), 1993, pp. 1830-1835
THE EFFECT OF RESIDUAL-STRESSES ON HARDNESS MEASUREMENTS (VOL 33, PG 167, 1993)
Authors: FRANKEL J ABBATE A SCHOLZ W
Citation: J. Frankel et al., THE EFFECT OF RESIDUAL-STRESSES ON HARDNESS MEASUREMENTS (VOL 33, PG 167, 1993), Experimental mechanics, 33(3), 1993, pp. 211-211
THE EFFECT OF RESIDUAL-STRESSES ON HARDNESS MEASUREMENTS
Authors: FRANKEL J ABBATE A SCHOLZ W
Citation: J. Frankel et al., THE EFFECT OF RESIDUAL-STRESSES ON HARDNESS MEASUREMENTS, Experimental mechanics, 33(2), 1993, pp. 164-168
Risultati: 1-13 |