Citation: Ra. Reed et al., IMPLICATIONS OF ANGLE OF INCIDENCE IN SEU TESTING OF MODERN CIRCUITS, IEEE transactions on nuclear science, 41(6), 1994, pp. 2049-2054
Authors:
REED RA
MCNULTY PJ
BEAUVAIS WJ
ABDELKADER WG
STASSINOPOULOS EG
BARTH JCL
Citation: Ra. Reed et al., A SIMPLE ALGORITHM FOR PREDICTING PROTON SEU RATES IN-SPACE COMPARED TO THE RATES MEASURED ON THE CRRES SATELLITE, IEEE transactions on nuclear science, 41(6), 1994, pp. 2389-2395