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Results: 1-8 |
Results: 8
ELEMENTAL COMPOSITION OF SEDIMENTS DETERMINED BY TTPIXE
Authors: MARTIN JE GARCIATENORIO R RESPALDIZA MA AGER FJ DASILVA MF
Citation: Je. Martin et al., ELEMENTAL COMPOSITION OF SEDIMENTS DETERMINED BY TTPIXE, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 139(1-4), 1998, pp. 175-179
ANALYSIS OF THE ELEMENTS SPUTTERED DURING THE LANTHANUM IMPLANTATION IN STAINLESS-STEELS
Authors: AGER FJ RESPALDIZA MA PAUL A ODRIOZOLA JA LOBATO JM DASILVA MF REDONDO LM SOARES JC
Citation: Fj. Ager et al., ANALYSIS OF THE ELEMENTS SPUTTERED DURING THE LANTHANUM IMPLANTATION IN STAINLESS-STEELS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 139(1-4), 1998, pp. 344-349
ION-BEAM ANALYSIS AND ALPHA-SPECTROMETRY OF SOURCES ELECTRODEPOSITED ON SEVERAL BACKINGS
Authors: CALABUIG JLF TOME FV SANCHEZ AM GARCIA CR DASILVA MF SOARES JC AGER FJ BARBER DJ MONTERO PR
Citation: Jlf. Calabuig et al., ION-BEAM ANALYSIS AND ALPHA-SPECTROMETRY OF SOURCES ELECTRODEPOSITED ON SEVERAL BACKINGS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 138, 1998, pp. 290-296
OXIDE SCALE DEPTH PROFILING OF LANTHANUM-DEPOSITED AISI-304 - AN ION-BEAM ANALYSIS
Authors: AGER FJ RESPALDIZA MA PAUL A ODRIOZOLA JA DASILVA MF SOARES JC
Citation: Fj. Ager et al., OXIDE SCALE DEPTH PROFILING OF LANTHANUM-DEPOSITED AISI-304 - AN ION-BEAM ANALYSIS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 138, 1998, pp. 1045-1051
CHARACTERIZATION OF ALPHA-SOURCES PREPARED BY DIRECT EVAPORATION USING RUTHERFORD BACKSCATTERING SPECTROMETRY
Authors: RODRIGUEZ PB SANCHEZ AM TOME FV CALABUIG JLF GARCIA CR BARBER DJ AGER FJ DASILVA MF SOARES JC
Citation: Pb. Rodriguez et al., CHARACTERIZATION OF ALPHA-SOURCES PREPARED BY DIRECT EVAPORATION USING RUTHERFORD BACKSCATTERING SPECTROMETRY, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 132(3), 1997, pp. 501-506
SPUTTERING STUDIES DURING LANTHANUM IMPLANTATION IN STAINLESS-STEELS
Authors: AGER FJ RESPALDIZA MA SOARES JC DASILVA MF ODRIOZOLA JA
Citation: Fj. Ager et al., SPUTTERING STUDIES DURING LANTHANUM IMPLANTATION IN STAINLESS-STEELS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 127, 1997, pp. 791-795
RUTHERFORD BACKSCATTERING SPECTROMETRY (RBS) CHARACTERIZATION OF OXIDE SCALE FORMED ON (AISI-304) STEEL AFTER SURFACE DEPOSITION OF LANTHANUM
Authors: AGER FJ RESPALDIZA MA BOTELLA J SOARES JC DASILVA MF BENITEZ JJ ODRIOZOLA JA
Citation: Fj. Ager et al., RUTHERFORD BACKSCATTERING SPECTROMETRY (RBS) CHARACTERIZATION OF OXIDE SCALE FORMED ON (AISI-304) STEEL AFTER SURFACE DEPOSITION OF LANTHANUM, Acta materialia, 44(2), 1996, pp. 675-681
THERMAL AND PHOTOCHEMICAL METHODS FOR THE PREPARATION OF THIN-FILMS OF CERMET MATERIALS
Authors: LASSALETTA G GONZALEZELIPE AR JUSTO A FERNANDEZ A AGER FJ RESPALDIZA MA SOARES JC DASILVA MF
Citation: G. Lassaletta et al., THERMAL AND PHOTOCHEMICAL METHODS FOR THE PREPARATION OF THIN-FILMS OF CERMET MATERIALS, Journal of Materials Science, 31(9), 1996, pp. 2325-2332
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