Authors: ALLAN GA WALTON AJ

Citation: Ga. Allan et Aj. Walton, CRITICAL AREA EXTRACTION FOR SOFT FAULT ESTIMATION, IEEE transactions on semiconductor manufacturing, 11(1), 1998, pp. 146-154

Authors: WALTON AJ FALLON M NEWSAM MI FERGUSON RS SPREVAK D ELLIOTT JP ALLAN GA

Citation: Aj. Walton et al., TOTAL TCAD STRATEGY FOR DFM IN IC TECHNOLOGY DEVELOPMENT, IEE proceedings. Science, measurement and technology, 144(2), 1997, pp. 63-68

Authors: ALLAN GA WALTON AJ

Citation: Ga. Allan et Aj. Walton, EFFICIENT CRITICAL AREA MEASUREMENTS OF IC LAYOUT APPLIED TO QUALITY AND RELIABILITY ENHANCEMENT, Microelectronics and reliability, 37(12), 1997, pp. 1825-1833