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Results: 51-62/62
Authors:
ALSHAREEF HN
BELLUR KR
KINGON AI
AUCIELLO O
Citation: Hn. Alshareef et al., INFLUENCE OF PLATINUM INTERLAYERS ON THE ELECTRICAL-PROPERTIES OF RUO2 PB(ZR0.53TI0.47)O-3/RUO2 CAPACITOR HETEROSTRUCTURES/, Applied physics letters, 66(2), 1995, pp. 239-241
Authors:
AUCIELLO O
RAY MA
PALMER D
DUARTE J
MCGUIRE GE
TEMPLE D
Citation: O. Auciello et al., LOW-VOLTAGE ELECTRON-EMISSION FROM PB(ZRXTI1-X)O-3-BASED THIN-FILM CATHODES, Applied physics letters, 66(17), 1995, pp. 2183-2185
Authors:
ALSHAREEF HN
KINGON AI
CHEN X
BELLUR KR
AUCIELLO O
Citation: Hn. Alshareef et al., CONTRIBUTION OF ELECTRODES AND MICROSTRUCTURES TO THE ELECTRICAL-PROPERTIES OF PB(ZR0.53TI0.47)O-3 THIN-FILM CAPACITORS, Journal of materials research, 9(11), 1994, pp. 2968-2975
Authors:
KRAUSS AR
LIN Y
AUCIELLO O
LAMICH GJ
GRUEN DM
SCHULTZ JA
CHANG RPH
Citation: Ar. Krauss et al., PULSED ION-BEAM SURFACE-ANALYSIS AS A MEANS OF IN-SITU REAL-TIME ANALYSIS OF THIN-FILMS DURING GROWTH, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 12(4), 1994, pp. 1943-1957
Authors:
LIN YP
KRAUSS AR
AUCIELLO O
NISHINO Y
GRUEN DM
CHANG RPH
SCHULTZ JA
Citation: Yp. Lin et al., STUDIES OF THIN-FILM GROWTH, ADSORPTION, AND OXIDATION BY IN-SITU, REAL-TIME, AND EX-SITU ION-BEAM ANALYSIS, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 12(4), 1994, pp. 1557-1564
Authors:
ALSHAREEF HN
BELLUR KR
AUCIELLO O
CHEN X
KINGON AI
Citation: Hn. Alshareef et al., EFFECT OF COMPOSITION AND ANNEALING CONDITIONS ON THE ELECTRICAL-PROPERTIES OF PB(ZRXTI1-X)O3 THIN-FILMS DEPOSITED BY THE SOL-GEL PROCESS, Thin solid films, 252(1), 1994, pp. 38-43
Authors:
CHOW AF
LICHTENWALNER DJ
WOOLCOTT RR
GRAETTINGER TM
AUCIELLO O
KINGON AI
BOATNER LA
PARIKH NR
Citation: Af. Chow et al., EPITAXIAL KNBO3 THIN-FILMS ON KTAO3, MGAL2O4, AND MGO SUBSTRATES, Applied physics letters, 65(9), 1994, pp. 1073-1075
Authors:
AUCIELLO O
GIFFORD KD
KINGON AI
Citation: O. Auciello et al., CONTROL OF STRUCTURE AND ELECTRICAL-PROPERTIES OF LEAD-ZIRCONIUM-TITANATE-BASED FERROELECTRIC CAPACITORS PRODUCED USING A LAYER-BY-LAYER ION-BEAM SPUTTER-DEPOSITION TECHNIQUE, Applied physics letters, 64(21), 1994, pp. 2873-2875
Authors:
DAT R
LICHTENWALNER DJ
AUCIELLO O
KINGON AI
Citation: R. Dat et al., POLYCRYSTALLINE LA0.5SR0.5COO3 PBZR0.53TI0.47O3 LA0.5SR0.5COO3 FERROELECTRIC CAPACITORS ON PLATINIZED SILICON WITH NO POLARIZATION FATIGUE, Applied physics letters, 64(20), 1994, pp. 2673-2675
Authors:
RAMESH R
LEE J
SANDS T
KERAMIDAS VG
AUCIELLO O
Citation: R. Ramesh et al., ORIENTED FERROELECTRIC LA-SR-CO-O PB-LA-ZR-TI-O/LA-SR-CO-O HETEROSTRUCTURES ON [001] PT/SIO2 SI SUBSTRATES USING A BISMUTH TITANATE TEMPLATE LAYER/, Applied physics letters, 64(19), 1994, pp. 2511-2513
Authors:
LICHTENWALNER DJ
AUCIELLO O
DAT R
KINGON AI
Citation: Dj. Lichtenwalner et al., INVESTIGATION OF THE ABLATED FLUX CHARACTERISTICS DURING PULSED-LASERABLATION DEPOSITION OF MULTICOMPONENT OXIDES, Journal of applied physics, 74(12), 1993, pp. 7497-7505
Authors:
AUCIELLO O
MANTESE L
DUARTE J
CHEN X
ROU SH
KINGON AI
SCHREINER AF
KRAUSS AR
Citation: O. Auciello et al., SYNTHESIS AND CHARACTERIZATION OF PB (ZRXTI1-X)O3 THIN-FILMS PRODUCEDBY AN AUTOMATED LASER ABLATION DEPOSITION TECHNIQUE, Journal of applied physics, 73(10), 1993, pp. 5197-5207