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Results: 1-25/31
Authors:
AZZAM RMA
ELSABA AM
ABUSHAGUR MAG
Citation: Rma. Azzam et al., SPECTROPHOTOPOLARIMETER BASED ON MULTIPLE REFLECTIONS IN A COATED DIELECTRIC SLAB, Thin solid films, 313, 1998, pp. 53-57
Authors:
MAHMOUD F
AZZAM RMA
Citation: F. Mahmoud et Rma. Azzam, OPTICAL MONITOR FOR CONTAMINATION ON HV INSULATOR SURFACES, IEEE transactions on dielectrics and electrical insulation, 4(1), 1997, pp. 33-38
Authors:
LIU J
AZZAM RMA
Citation: J. Liu et Rma. Azzam, EFFECT OF LIGHT-BEAM DEVIATION ON THE INSTRUMENT MATRIX OF THE 4-DETECTOR PHOTOPOLARIMETER, Optical engineering, 36(3), 1997, pp. 943-951
Authors:
AZZAM RMA
HOWLADER NMK
Citation: Rma. Azzam et Nmk. Howlader, INFRARED REFLECTION POLARIZERS USING UNIFORM AND GAUSSIAN LOW-INDEX LAYERS BURIED IN HIGH-INDEX SUBSTRATES, Optical engineering, 36(1), 1997, pp. 217-221
Authors:
LIU J
AZZAM RMA
Citation: J. Liu et Rma. Azzam, CORNER-CUBE 4-DETECTOR PHOTOPOLARIMETER, Optics and Laser Technology, 29(5), 1997, pp. 233-238
Authors:
LIU J
AZZAM RMA
Citation: J. Liu et Rma. Azzam, POLARIZATION PROPERTIES OF CORNER-CUBE RETROREFLECTORS - THEORY AND EXPERIMENT, Applied optics, 36(7), 1997, pp. 1553-1559
Authors:
AZZAM RMA
HOWLADER MMK
Citation: Rma. Azzam et Mmk. Howlader, SILICON-BASED POLARIZATION OPTICS FOR THE 1.30 AND 1.55 MU-M COMMUNICATION WAVELENGTHS, Journal of lightwave technology, 14(5), 1996, pp. 873-878
Authors:
ELSABA AM
AZZAM RMA
ABUSHAGUR MAG
Citation: Am. Elsaba et al., PARALLEL-SLAB DIVISION-OF-AMPLITUDE PHOTOPOLARIMETER, Optics letters, 21(21), 1996, pp. 1709-1711
Authors:
CUI Y
AZZAM RMA
Citation: Y. Cui et Rma. Azzam, 16-BEAM GRATING-BASED DIVISION-OF-AMPLITUDE PHOTOPOLARIMETER, Optics letters, 21(1), 1996, pp. 89-91
Authors:
AZZAM RMA
HOWLADER MMK
Citation: Rma. Azzam et Mmk. Howlader, BILAYER COATINGS THAT PRODUCE A 90-DEGREES DIFFERENTIAL REFLECTION PHASE-SHIFT AT OBLIQUE-INCIDENCE - ALL POSSIBLE SOLUTIONS, Thin solid films, 272(1), 1996, pp. 143-147
Authors:
LIU J
AZZAM RMA
Citation: J. Liu et Rma. Azzam, INFRARED QUARTER-WAVE REFLECTION RETARDERS DESIGNED WITH HIGH-SPATIAL-FREQUENCY DIELECTRIC SURFACE-RELIEF GRATINGS ON A GOLD SUBSTRATE AT OBLIQUE-INCIDENCE, Applied optics, 35(28), 1996, pp. 5557-5562
Authors:
CUI Y
AZZAM RMA
Citation: Y. Cui et Rma. Azzam, DETERMINATION OF THE REFRACTIVE-INDEX AND THICKNESS OF TRANSPARENT PELLICLES BY USE OF THE POLARIZATION-INDEPENDENT ABSENTEE-LAYER CONDITION, Applied optics, 35(25), 1996, pp. 5040-5043
Authors:
CUI Y
AZZAM RMA
Citation: Y. Cui et Rma. Azzam, APPLICATIONS OF THE NORMAL-INCIDENCE ROTATING-SAMPLE ELLIPSOMETER TO HIGH-SPATIAL-FREQUENCY AND LOW-SPATIAL-FREQUENCY GRATINGS, Applied optics, 35(13), 1996, pp. 2235-2238
Authors:
AZZAM RMA
ELSABA AM
Citation: Rma. Azzam et Am. Elsaba, MAXIMUM RATE OF CHANGE OF THE DIFFERENTIAL REFLECTION PHASE-SHIFT WITH RESPECT TO THE ANGLE OF INCIDENCE FOR LIGHT-REFLECTION AT THE SURFACE OF AN ABSORBING MEDIUM (VOL 28, PG 1365, 1989), Applied optics, 35(1), 1996, pp. 213-213
Authors:
AZZAM RMA
HOWLADER MMK
GEORGIOU TY
Citation: Rma. Azzam et al., SINGLE-LAYER-COATED SURFACES WITH LINEARIZED REFLECTANCE VERSUS ANGLEOF INCIDENCE - APPLICATION TO PASSIVE AND ACTIVE SILICON ROTATION SENSORS, Journal of the Optical Society of America. A, Optics, image science,and vision., 12(8), 1995, pp. 1790-1796
Authors:
KANAN AM
AZZAM RMA
Citation: Am. Kanan et Rma. Azzam, PRINCIPAL ANGLES AND PRINCIPAL AZIMUTHS OF IN-LINE SYMMETRICAL 3-REFLECTION MIRROR SYSTEM - APPLICATION TO CIRCULAR-POLARIZATION OF VACUUM-ULTRAVIOLET RADIATION, Optical engineering, 34(6), 1995, pp. 1551-1557
Authors:
HOWLADER MMK
AZZAM RMA
Citation: Mmk. Howlader et Rma. Azzam, PERIODIC AND QUASI-PERIODIC NONQUARTERWAVE MULTILAYER COATINGS FOR 90-DEG REFLECTION PHASE RETARDATION AT 45-DEG ANGLE OF INCIDENCE, Optical engineering, 34(3), 1995, pp. 869-875
Authors:
AZZAM RMA
Citation: Rma. Azzam, CHARACTERIZATION OF NATIVE AND ADSORBED THIN-FILMS ON SILICON DETECTOR SURFACES - STATIC AND KINETIC APPLICATIONS, Thin solid films, 270(1-2), 1995, pp. 289-294
Authors:
AZZAM RMA
HOWLADER MMK
Citation: Rma. Azzam et Mmk. Howlader, REAL-TIME ADSORPTION-DESORPTION THIN-FILM OPTICAL MONITOR USING A WINDOWLESS REFLECTIVE SILICON PHOTODETECTOR, Review of scientific instruments, 66(8), 1995, pp. 4362-4366
Authors:
CUI Y
AZZAM RMA
Citation: Y. Cui et Rma. Azzam, CALIBRATION AND TESTING OF A 16-BEAM GRATING-BASED DIVISION-OF-AMPLITUDE PHOTOPOLARIMETER, Review of scientific instruments, 66(12), 1995, pp. 5552-5558
Authors:
BOUZID A
ABUSHAGUR MAG
ELSABAE A
AZZAM RMA
Citation: A. Bouzid et al., FIBEROPTIC 4-DETECTOR POLARIMETER, Optics communications, 118(3-4), 1995, pp. 329-334
Authors:
AZZAM RMA
KANAN AM
Citation: Rma. Azzam et Am. Kanan, EXTREME-ULTRAVIOLET POLARIZING OPTICS USING BARE AND ALUMINUM-COATED SILICON-CARBIDE, Applied optics, 34(28), 1995, pp. 6438-6442
Authors:
AZZAM RMA
Citation: Rma. Azzam, DIRECT RELATION BETWEEN FRESNELS INTERFACE REFLECTION COEFFICIENTS FOR THE PARALLEL AND PERPENDICULAR POLARIZATIONS - ERRATUM-2 (VOL 69, PG1007, 1979), Journal of the Optical Society of America. A, Optics, image science,and vision., 11(7), 1994, pp. 2159-2159
Authors:
AZZAM RMA
Citation: Rma. Azzam, POLARIZATION-INDEPENDENT BEAM SPLITTER BASED ON LIGHT-REFLECTION BY AUNIAXIAL CRYSTAL-SURFACE, AND AN IMMERSION METHOD FOR DETERMINING THECRYSTALS PRINCIPAL REFRACTIVE-INDEXES, J. mod. opt., 41(7), 1994, pp. 1473-1478
Authors:
KANAN AM
AZZAM RMA
Citation: Am. Kanan et Rma. Azzam, IN-LINE QUARTER-WAVE RETARDERS FOR THE INFRARED USING TOTAL REFRACTION AND TOTAL INTERNAL-REFLECTION IN A PRISM, Optical engineering, 33(6), 1994, pp. 2029-2033